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Transients spanning more than one clock cycle will challenge soft error tolerant designs for future technologies. To face this problem, a low overhead technique that uses bulk built-in current sensors and recomputation is proposed here.
This work presents a fault-tolerant version of the mass-produced 8-bit microprocessor M68HC11. It is able to tolerate single event transients (SETs) and single event upsets (SEUs). Based on triple modular redundancy (TMR) and time redundancy (TR) fault tolerance techniques, a protection scheme was implemented at high level in the sensitive areas of the microprocessor by using only standard gates in...
Connecting a built-in current sensor in the design bulk of a digital system increases sensitivity for detecting transient upsets in combinational and sequential logic. SPICE simulations validate this approach and show only minor penalties in terms of area, performance, and power consumption
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