Search results for: Kwang-Jow Gan
Analog Integrated Circuits and Signal Processing > 2018 > 96 > 1 > 9-19
Analog Integrated Circuits and Signal Processing > 2018 > 96 > 3 > 409-416
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 610 - 616
Engineering Science and Technology, an International Journal > 2016 > 19 > 2 > 888-893
Microelectronics Reliability > 2013 > 53 > 2 > 265-269
IEEE Transactions on Electron Devices > 2012 > 59 > 5 > 1410 - 1415
Analog Integrated Circuits and Signal Processing > 2012 > 70 > 1 > 141-145
Analog Integrated Circuits and Signal Processing > 2012 > 73 > 1 > 409-414
Microelectronics Journal > 2011 > 42 > 2 > 477-482
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 7 - 12
Analog Integrated Circuits and Signal Processing > 2011 > 68 > 3 > 379-385
Solid State Electronics > 2010 > 54 > 12 > 1637-1640
Analog Integrated Circuits and Signal Processing > 2010 > 62 > 1 > 63-68
Analog Integrated Circuits and Signal Processing > 2009 > 59 > 2 > 161-167