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The long-range and adhesion forces between a molecularly smooth silica sphere and a relatively smooth thin metallic film have been measured by atomic force microscopy (AFM) operating in contact mode. The majority of the dispersion force measurements have been done with root mean square (RMS) roughness of more than 10nm. This paper investigates lower roughness to prove or disprove theory of the van...
The force–distance curves of 12-2-12 and 12-4-12 Gemini quaternary ammonium bromide surfactants on mica and silica surfaces obtained by atomic force microscopy (AFM) were correlated with the structure of the adsorption layer. The critical micelle concentration was measured in the presence or absence of electrolyte. The electrolyte effect (the decrease of CMC) is significantly more pronounced for Gemini...
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