Search results for: A. Paccagnella
Microelectronic Engineering > 2007 > 84 > 9-10 > 1956-1959
Microelectronics Reliability > 2007 > 47 > 9-11 > 1349-1352
Microelectronics Reliability > 2007 > 47 > 4-5 > 602-605
IEEE Transactions on Nuclear Science > 2007 > 54 > 6-1 > 2257 - 2263
IEEE Transactions on Nuclear Science > 2007 > 54 > 6-1 > 1891 - 1897
IEEE Transactions on Nuclear Science > 2007 > 54 > 6-1 > 2204 - 2209
IEEE Transactions on Nuclear Science > 2007 > 54 > 6-1 > 2196 - 2203
IEEE Transactions on Nuclear Science > 2007 > 54 > 6-1 > 2371 - 2378
IEEE Transactions on Nuclear Science > 2007 > 54 > 6-1 > 1898 - 1905
IEEE Transactions on Nuclear Science > 2007 > 54 > 4-2 > 1066 - 1070
IEEE Transactions on Nuclear Science > 2007 > 54 > 4-2 > 1184 - 1189
Microelectronics Reliability > 2006 > 46 > 9-11 > 1750-1753
Microelectronics Reliability > 2006 > 46 > 9-11 > 1669-1672