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Applicability of STEM-in-SEM for polymer characterization, particularly for a manufacturing environment, was explored through analysis of a wide range of commercially significant polymer systems. STEM-in-SEM studies of engineering thermoplastic blends and composites, using samples prepared for TEM studies, showed excellent comparison to TEM micrographs. Important structural details of multi-phase...
Four point probe measurements of the surface electrical resistance at an oxide film–metal interface and at an oxide–film semiconductor interface have shown with Å sensitivity that the direction of the buried interface motion during oxide film growth is opposite in the two cases in accordance with the Mott–Cabrera theory. During the formation of amorphous Al 2 O 3 layers on Al(111)...
We studied the electron-beam-induced deposition of carbon on Si(100) at room temperature. Ethylene molecules dosed from the background were adsorbed on the surface and decomposed by an electron-beam. The chemical properties and structure of the resulting carbon film, as well as its evolution with the dose of ethylene and annealing temperature after dosing, were investigated by Auger electron spectroscopy...
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