The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
The in-situ detection of failures in microelectronic packages in an experiment is still a big challenge. The reliability of most packages will be qualified by measuring the electrical resistance of daisy chain structures. The moment of failure in the electrical sig-nals or the changes in the resistance are used for reliability or lifetime estimations. But the correlation of electrical resistance in...
One major challenge for power and microelectronics system integration today is the assurance of reliability, very often mastered by a carefully tuned interplay of the still dissimilar materials that make up a package, first under optimized processing conditions, and then often under combined loading conditions. Therefore, not only during design but also during test and operation it would be desirable...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.