Search results for: A. Łaszcz
Springer Proceedings in Physics > Microscopy of Semiconducting Materials > Scanning Electron and Scanning Probe Advances > 511-514
Polish Journal of Chemical Technology > 2014 > Vol. 16, nr 3 > 40--44
Optica Applicata > 2013 > Vol. 43, nr 1 > 5--15
Thin Solid Films > 2012 > 520 > 13 > 4501-4505
Journal of Microscopy > 237 > 3 > 379 - 383
Journal of Microscopy > 237 > 3 > 347 - 351
Acta Physica Polonica A > 2009 > 116 > S > S-89-S-91
Materials Science & Engineering B > 2008 > 154-155 > Complete > 159-162
Materials Science & Engineering B > 2008 > 154-155 > Complete > 175-178
IEEE Electron Device Letters > 2008 > 29 > 2 > 152 - 154
Nuclear Inst. and Methods in Physics Research, B > 2006 > 253 > 1-2 > 274-277
Archives of Metallurgy and Materials > 2006 > Vol. 51, iss. 4 > 551-554
Journal of Alloys and Compounds > 2004 > 382 > 1-2 > 24-28
Materials Chemistry and Physics > 2003 > 81 > 2-3 > 260-264
Kompozyty > 2001 > R. 1, nr 2 > 246-249