Search results for: Deok-Hoon Kim
LWT - Food Science and Technology > 2018 > 90 > C > 636-642
Microelectronics Reliability > 2003 > 43 > 6 > 879-894
Microelectronics Reliability > 2002 > 42 > 12 > 1837-1848
LWT - Food Science and Technology > 2018 > 90 > C > 636-642
Microelectronics Reliability > 2003 > 43 > 6 > 879-894
Microelectronics Reliability > 2002 > 42 > 12 > 1837-1848