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Isotope Exchange/Depth Profiling (IEDP) using secondary ion mass spectrometry (SIMS) has been used to determine the oxygen tracer diffusion and surface exchange coefficients of (100) oriented 9.5 mol % yttria stabilised zirconia single crystals. The activation enthalpy for oxygen tracer diffusion was found to be 0.9 eV in the temperature range 450-650°C, and 0.8 eV in the temperature range 650-1100°C...
Isotopic Exchange Depth Profiling (IEDP) using Secondary Ion Mass Spectrometry (SIMS) has been used to investigate oxygen self-diffusion and surface exchange reactions in the related fluorites, yttria stabilised zirconia (YSZ) and gadolinia doped ceria (CGO). The nature of the exchange reaction between the gas and the surface of the solid has been explored using the gas phase analysis technique....
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