Search results for: Xing Duan
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 541 - 548
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 352 - 358
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 2834 - 2838