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As technology scales, small and dense geometries, and process variations introduce defects that are often not detected by single stuck-at tests. To improve defect coverage, we expand the single stuck-at tests to cover multiple stuck-at faults. This paper investigates multiple stuck-at fault (MSAF) testability of ROBDD (Reduced Ordered Binary Decision Diagram) based fully delay testable combinational...
System test plays a very important role in the product development cycle of a safety-critical device, such as an insulin pump. Given the significant risk of this device, fault-injection should be performed to validate dependable implementation under abnormal circumstances, namely: data corruption, bit flips, incorrect signal assertions and more. Clearly, a robust testbed is essential to create the...
In the product development life-cycle of hard-real-time embedded systems, software verification plays a very important role. During verification, a Hardware-In-Loop (HIL) testbed is used to test the key properties of the software, namely, schedulability, concurrency and timeliness, by exercising and monitoring the interfaces of the Design Under Test (DUT). Often, building a testbed to test these properties...
In this paper, we first discuss about high level formal verification and analysis techniques targeting C-based designs. They are based on dependence traversal and analyze design descriptions locally. An equivalence checking technique based on dependence traversal of the difference between the two design descriptions is shown. Then we introduce special mechanisms called patchable accelerators, for...
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