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Parametric fault testing of non-linear analog circuits based on a new mathematical transform is presented. The V-Transform acts on the polynomial expansion of the circuit's function. Its main properties are: 1) to make the polynomial coefficients monotonic, 2) to reduce masking of parametric faults due to process variation, and 3) to increase the sensitivity of polynomial coefficients to the circuit...
Parametric fault distinction between those arising from process variation as opposed to manufacturing defects in components of an analog integrated circuit is presented. Such a fault distinction has significance in the correction and calibration of process steps responsible for manufacturing defects, thereby improving manufacturing yield. In this paper, we begin by laying out foundations for high...
Multiple copies of the same functional units are common in today's design. It allows us to reduce golden reference storage by performing comparison of output response of the identical circuits when identical input sequence is applied to them. We present output response comparison scheme for identical sequential circuits for delay test using static transition probability. This allows us to make selection...
We propose a method for diagnosis of parametric faults in analog circuits using polynomial coefficients of the circuit model. As a sequel to our recent work, where circuit response is modeled as polynomial for uncovering parametric faults in nonlinear circuits, we propose diagnosis of such faults using sensitivity of coefficients of the estimated polynomial to circuit parameters. The proposed method...
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