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Decaps can be very effective in reducing power grid noise, but they cannot be inserted on a chip in an ad-hoc manner without considering the grid parasitic impedances, switching frequencies of the blocks, and proximity to the power supply pins. It is possible that a decoupling capacitor inserted into a vacant space left by a placer may not only be inefficient, but can also be detrimental. In this...
As the industry moves from single- to multicore processors, the challenges of how to reliably design and analyze power delivery for such systems also arise. We study various workload assignments to cores and their impact on the global power grid noise. We develop metrics to estimate the amount of noise propagated from core to core and propose a power supply noise aware workload assignment method....
In this paper, we present a reliability study of clock mesh distribution networks. We analyze the electromigration (EM) phenomena and demonstrate their occurrence in clock mesh networks (CMN). Due to shrinking feature sizes in more advanced technologies, EM is becoming a more prominent reliability issue. Process variation, power supply noise, and clock gating are some of the factors that can increase...
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