Search results for: S. Osowski
Metrology and Measurement Systems > 2017 > Vol. 24, nr 1 > 27--44
Expert Systems With Applications > 2012 > 39 > 10 > 9886-9891
IEEE Transactions on Instrumentation and Measurement > 2009 > 58 > 7 > 2159 - 2168
Proceedings. 2005 IEEE International Joint Conference on Neural Networks, 2005. > 4 > 2496 - 2501 vol. 4
Sensors & Actuators: B. Chemical > 2004 > 98 > 2-3 > 291-298