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Photon Emission Microscopy is the most widely used mainstream defect isolation technique in failure analysis labs. It is easy to perform and has a fast turnaround time for results. However, interpreting a photon emission micrograph to postulate the suspected defect site accurately is challenging when there are multiple abnormal hotspots and driving nets involved. This is commonly encountered in dynamic...
Voltage regulators are widely used in a circuit design nowadays. Voltage regulator failure is a critical yield loss in advanced technology nodes. Through a comprehensive study on circuit layout and process optimization, we demonstrated that voltage regulator failure can be tremendously reduced by optimizing the voltage regulators in circuit layout and using the novel laser anneal recipe. These two...
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