Search results for: Ying Cheng
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 4 > 500 - 508
IEEE Transactions on Electron Devices > 2006 > 53 > 12 > 2901 - 2907
IEEE Transactions on Electron Devices > 2006 > 53 > 11 > 2689 - 2695