Search results for: Yang
IEEE Journal of Solid-State Circuits > 2018 > 53 > 1 > 124 - 133
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2018 > 37 > 1 > 245 - 256
IEEE Transactions on Circuits and Systems II: Express Briefs > 2018 > 65 > 1 > 46 - 50
IEEE Transactions on Power Electronics > 2018 > 33 > 1 > 248 - 258
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 692 - 697
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5223 - 5229
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4875 - 4881
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 12 > 3355 - 3368
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5081 - 5086
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5230 - 5235
IEEE Transactions on Microwave Theory and Techniques > 2017 > 65 > 12-2 > 5203 - 5211
IEEE Electron Device Letters > 2017 > 38 > 11 > 1563 - 1566
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4393 - 4399
IEEE Micro > 2017 > 37 > 6 > 72 - 89
IEEE Transactions on Nanotechnology > 2017 > 16 > 6 > 999 - 1003
IEEE Transactions on Microwave Theory and Techniques > 2017 > 65 > 11-1 > 4190 - 4197
IEEE Transactions on Industrial Electronics > 2017 > 64 > 11 > 8971 - 8979