Search results for: Martin Trentzsch
IEEE Electron Device Letters > 2015 > 36 > 5 > 430 - 432
physica status solidi (a) > 212 > 3 > 547 - 553
Microelectronics Reliability > 2014 > 54 > 9-10 > 2306-2309
2014 IEEE International Reliability Physics Symposium > 2E.5.1 - 2E.5.5
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1278 - 1283
Solid State Electronics > 2013 > 88 > Complete > 65-68
IEEE Transactions on Electron Devices > 2013 > 60 > 7 > 2368 - 2371
IEEE Electron Device Letters > 2010 > 31 > 10 > 1149 - 1151