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Abstract -In this paper, an intelligent aging estimation method based on Sample Entropy (SampEn) is proposed for the lead-acid batteries serially connected in a string. This method can prevent the potential battery failure and guarantee the battery availability. Since SampEn can quantify the regularity of a data sequence, it can serve as an indicator for the aging or degradation of the lead-acid battery...
Modern electrical machines must be designed as rugged and flexible. The use of power electronic devices cause voltage spikes and introduce harmonics that electrically degrade the insulation of the windings in the machines. High frequency power electronic driver circuits also increase the operating temperatures, which affect the aging and breakdown properties of the machine winding insulation. High...
The electrical degradation of cable insulation in distribution lines is due to the electrical stress caused by switching surges. During the operation, the insulation of power cables will be placed under high electrical stress, including overvoltages caused by switching. The status of power cable insulation aging is evaluated by the measurement of partial discharge level and AC breakdown voltage. The...
Return Voltage Measurements are an effective tool to characterize the degradation of cellulose-oil-insulations and are widely used for the diagnosis of power cables. For power transformers the use is not so widespread. Nevertheless the application on power transformers is also very promising, especially because the geometry of the insulation system in a power transformer is closer to the conditions...
The objective of using logic BIST for online and periodic testing is to identify defects, like opens, resulting from the wear and tear of the circuit. We have shown that existing test sets have a low coverage for open defects located in scan flip-flops, even though such defects may affect functional operation. Existing Logic BIST structures suffer from the same limitations. A novel Logic BIST architecture...
Negative Bias Temperature Instability (NBTI) is one of the most critical device reliability issues facing scaled CMOS technology. In order to better understand the characteristics of this mechanism, accurate and efficient means of measuring its effects must be explored. In this work, we describe an on-chip NBTI degradation sensor using two delay-locked loops (DLL). The increase in PMOS transistor...
Predicting the residual energy of the battery source that powers a portable electronic device is imperative in designing and applying an effective dynamic power management policy for the device. This paper starts up by showing that a 30% error in predicting the battery capacity of a lithium-ion battery can result in up to 20% performance degradation for a dynamic voltage and frequency scaling algorithm...
This paper describes the results of various insulation degradation characteristics measured in functional tests using form-wound motorettes and discusses on the effective insulation diagnostics. The measured insulation degradation characteristics are insulation resistance, dissipation factor, discharge intensity, discharge phase, partial discharge characteristics, y, etc. and breakdown voltage. Different...
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