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IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 12 > 3464 - 3472
IEEE Sensors Letters > 2017 > 1 > 6 > 1 - 4
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 12 > 2057 - 2065
IEEE Transactions on Applied Superconductivity > 2017 > 27 > 8 > 1 - 11
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control > 2017 > 64 > 12 > 1864 - 1873
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 727 - 737
IEEE Geoscience and Remote Sensing Letters > 2017 > 14 > 12 > 2315 - 2319
IEEE Antennas and Propagation Magazine > 2017 > 59 > 6 > 88 - 101
IEEE Transactions on Professional Communication > 2017 > 60 > 4 > 448 - 457
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 763 - 772
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 758 - 762
Journal of Microelectromechanical Systems > 2017 > 26 > 6 > 1279 - 1286
IEEE Journal of Emerging and Selected Topics in Power Electronics > 2017 > 5 > 4 > 1761 - 1770
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 653 - 666
IEEE Transactions on Computational Imaging > 2017 > 3 > 4 > 774 - 782
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 672 - 677
IEEE Transactions on Reliability > 2017 > 66 > 4 > 1266 - 1279
Journal of Microelectromechanical Systems > 2017 > 26 > 6 > 1226 - 1234
IEEE Transactions on Human-Machine Systems > 2017 > 47 > 6 > 886 - 895
IEEE Transactions on Industrial Electronics > 2017 > 64 > 12 > 9322 - 9333