Wyniki wyszukiwania
IEEE Transactions on Instrumentation and Measurement > 2010 > 59 > 10 > 2630 - 2638
IEEE Transactions on Image Processing > 2010 > 19 > 9 > 2491 - 2501
IEEE Transactions on Pattern Analysis and Machine Intelligence > 2010 > 32 > 7 > 1329 - 1335