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IEEE Transactions on Reliability > 2016 > 65 > 1 > 54 - 69
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2015 > 34 > 12 > 2013 - 2024
2015 IEEE AUTOTESTCON > 58 - 64
IEEE Transactions on Reliability > 2016 > 65 > 1 > 54 - 69
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2015 > 34 > 12 > 2013 - 2024
2015 IEEE AUTOTESTCON > 58 - 64