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Integrated circuit (IC) diagnosis typically analyzes failed chips by reasoning about their responses to test patterns to deduce what has gone wrong. Current trends use diagnosis as the first step in extracting valuable information from a large population of failing ICs that include, for example, design-feature failure rates and defect-occurrence statistics. However, it is difficult to examine the...
Detection of bridging faults plays a significant role in a reversible circuit. The single and multiple inputs bridging faults model of a reversible circuit is considered here. The paper proposes that only n (number of inputs) number of universal test vectors are sufficient for detection of all single and multiple input bridging faults and all input stuck-at faults of any n-input and n-output reversible...
Defects in the modern LSIs manufactured by the deep-submicron technologies are known to cause complex faulty phenomena. Testing by targeting only stuck-at or bridging faults is no longer sufficient. Yet, increasing defect coverage is even more important. A stuck-open fault model considers transistor level defects, many of which are not covered by a stuck-at fault model. Further, test vectors for stuck-open...
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