Search results
IEEE Transactions on Image Processing > 2018 > 27 > 2 > 778 - 790
IEEE Transactions on Industrial Electronics > 2018 > 65 > 2 > 1539 - 1548
IEEE Transactions on Power Electronics > 2018 > 33 > 2 > 926 - 931
IEEE Transactions on Electromagnetic Compatibility > 2018 > 60 > 1 > 243 - 251
IEEE Transactions on Electromagnetic Compatibility > 2018 > 60 > 1 > 107 - 114
IEEE Transactions on Power Electronics > 2018 > 33 > 2 > 1585 - 1596
IEEE Transactions on Power Electronics > 2018 > 33 > 2 > 1143 - 1153
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 1 - 10
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 73 - 81
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 23 - 36
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 201 - 205
IEEE Journal of Solid-State Circuits > 2018 > 53 > 1 > 247 - 260
IEEE Electron Device Letters > 2018 > 39 > 1 > 95 - 98
IEEE Electron Device Letters > 2018 > 39 > 1 > 143 - 146
IEEE Electron Device Letters > 2018 > 39 > 1 > 131 - 134
IEEE Electron Device Letters > 2018 > 39 > 1 > 59 - 62
IEEE Electron Device Letters > 2018 > 39 > 1 > 135 - 138
IEEE Electron Device Letters > 2018 > 39 > 1 > 147 - 150
IEEE Electron Device Letters > 2018 > 39 > 1 > 75 - 78
IEEE Electron Device Letters > 2018 > 39 > 1 > 4 - 7