Search results
IEEE Transactions on Reliability > 2017 > 66 > 3 > 735 - 750
IEEE Journal of the Electron Devices Society > 2017 > 5 > 5 > 416 - 425
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 9 > 2561 - 2574
IEEE Transactions on Computers > 2017 > 66 > 9 > 1599 - 1612
IEEE Transactions on Reliability > 2017 > 66 > 3 > 662 - 676
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 8 > 957 - 961
IEEE Sensors Letters > 2017 > 1 > 4 > 1 - 4
IEEE Transactions on Parallel and Distributed Systems > 2017 > 28 > 8 > 2314 - 2327
IEEE Transactions on Emerging Topics in Computing > 2017 > 5 > 3 > 304 - 316