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IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2010 > 29 > 5 > 844 - 848
2009 International Conference on Test and Measurement > 2 > 287 - 290
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2010 > 29 > 5 > 844 - 848
2009 International Conference on Test and Measurement > 2 > 287 - 290