Search results
IEEE Instrumentation & Measurement Magazine > 2017 > 20 > 6 > 22 - 29
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 12 > 3539 - 3542
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 713 - 721
IEEE Transactions on Reliability > 2017 > 66 > 4 > 1144 - 1156
IEEE Transactions on Reliability > 2017 > 66 > 4 > 1309 - 1330
IEEE Transactions on Reliability > 2017 > 66 > 4 > 1110 - 1119
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 708 - 712
IEEE Communications Letters > 2017 > 21 > 12 > 2550 - 2553
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 653 - 666
IEEE Transactions on Reliability > 2017 > 66 > 4 > 1012 - 1024
IEEE Transactions on Knowledge and Data Engineering > 2017 > 29 > 12 > 2643 - 2654
IEEE Transactions on Reliability > 2017 > 66 > 4 > 1085 - 1100
IEEE/ACM Transactions on Networking > 2017 > 25 > 6 > 3237 - 3252
IEEE Transactions on Information Forensics and Security > 2017 > 12 > 12 > 3065 - 3080
IEEE Transactions on Industrial Informatics > 2017 > 13 > 6 > 2834 - 2843
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 608 - 615
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 795 - 798
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 799 - 801
IEEE Transactions on Reliability > 2017 > 66 > 4 > 1293 - 1308
IEEE Internet of Things Journal > 2017 > 4 > 6 > 2047 - 2057