Search results
IEEE Transactions on Reliability > 2017 > 66 > 4 > 1120 - 1143
IEEE Transactions on Reliability > 2017 > 66 > 4 > 1229 - 1237
IEEE Sensors Letters > 2017 > 1 > 6 > 1 - 4
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 12 > 3420 - 3433
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 600 - 607
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 12 > 3228 - 3236
IEEE Transactions on Network and Service Management > 2017 > 14 > 4 > 1032 - 1045
IEEE Transactions on Reliability > 2017 > 66 > 4 > 1238 - 1252
IEEE Transactions on Nuclear Science > 2017 > 64 > 12 > 2933 - 2937
IEEE Electron Device Letters > 2017 > 38 > 12 > 1763 - 1766
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 727 - 737
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 12 > 2087 - 2094
IEEE Transactions on Reliability > 2017 > 66 > 4 > 1036 - 1047
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 773 - 779
IEEE Internet of Things Journal > 2017 > 4 > 6 > 1978 - 1986
IET Intelligent Transport Systems > 2017 > 11 > 10 > 659 - 666
Journal of Microelectromechanical Systems > 2017 > 26 > 6 > 1417 - 1427
IEEE Transactions on Biomedical Circuits and Systems > 2017 > 11 > 6 > 1488 - 1499
IEEE Transactions on Reliability > 2017 > 66 > 4 > 966 - 979