Wyniki wyszukiwania
2016 IEEE Electrical Insulation Conference (EIC) > 511 - 514
IEC 61671-6 Edition 1.0 2016-4 > 1 - 38
IEC 61671-5 Edition 1.0 2016-4 > 1 - 32
IEC 61671-4 Edition 1.0 2016-4 > 1 - 60
IEEE Design & Test > 2016 > 33 > 1 > 77 - 84
Journal of Electronic Testing > 2016 > 32 > 3 > 257-271
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2525 - 2531
2015 IEEE AUTOTESTCON > 374 - 379
2015 IEEE AUTOTESTCON > 181 - 185
2015 International SoC Design Conference (ISOCC) > 335 - 336
Microelectronics Reliability > 2015 > 55 > 2 > 374-382