Search results
Journal of Electronic Testing > 2018 > 34 > 2 > 147-161
Journal of Electronic Testing > 2018 > 34 > 3 > 233-253
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 10 > 2638 - 2646
Measurement > 2017 > 103 > C > 87-92
Journal of Microelectromechanical Systems > 2017 > 26 > 2 > 344 - 350
IEEE Std 1445-1998 > 1 - 108
IEEE Design & Test > 2016 > 33 > 6 > 5 - 6
IEEE Design & Test > 2016 > 33 > 6 > 15 - 22
IEEE Transactions on Instrumentation and Measurement > 2016 > 65 > 7 > 1651 - 1660