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2010 International Conference on Electronics and Information Engineering > 1 > V1-315 - V1-319
IEEE Transactions on Instrumentation and Measurement > 2010 > 59 > 6 > 1589 - 1599
2010 International Conference on Electronics and Information Engineering > 1 > V1-315 - V1-319
IEEE Transactions on Instrumentation and Measurement > 2010 > 59 > 6 > 1589 - 1599