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A new approach of rapid fabrication of intermetallic compounds (IMCs) solder joints at ambient temperature was investigated in this work. The high share strength Cu/Sn/Cu solder joints were obtained by using different strong electric currents 0.8KA, 0.9KA, 1.0KA, and 1.2KA for only about 0.2s. The Sn foils with the thickness of 10μm were used as solders. The results showed that with the current intensities...
A new approach of rapid fabrication of intermetallic compounds (IMCs) solder joints at ambient temperature was investigated in this work. The high share strength Cu/Sn/Cu solder joints were obtained by using different strong electric currents 0.8KA, 0.9KA, 1.0KA, and 1.2KA for only about 0.2s. The Sn foils with the thickness of 10μm were used as solders. The results showed that with the current intensities...
We observed various EM-induced failures in current-stressed Cu/Sn/Cu flip-chip solder joints. EM-induced Cu-pad consumption occurred at the current-entry point (maximum current-density) on the cathode interface, and voiding occurred at the other joint corner away from the current-entry point (minimum current-density). We believe that the above various EM-induced failure modes were the result of different...
Electromigration (EM) of micro bumps of 50 mum pitch was studied using four-point Kelvin structure. Two kinds of bumps, i. e., SnAg solder bump and Cu post with SnAg solder were tested. These bumps with thick Cu under bump metallization (UBM) were bonded with electroless Ni/Au (ENIG) pads. The results showed different EM features comparing with larger flip chip joints. Under various test temperatures...
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