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Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. Soft error rate (SER) measurement, expressed as number of failures encountered per billion hours of device operation, is time consuming and involves significant test cost. The cost stems from having to connect a device-under-test to a tester for...
With technology scaling, vulnerability to soft errors in random logic is increasing. There is a need for on-line error detection and protection for logic gates even at sea level. The error checker is the key element for an on-line detection mechanism. We compare three different checkers for error detection from the point of view of area, power and false error detection rates. We find that the double...
A new low-jitter polyphase-filter-based frequency multiplier incorporating a phase error calibration circuit to reduce the phase errors is presented. Designing with a multiplication ratio of eight, it has been fabricated in a 0.13-mum CMOS process. For input frequency of 25 MHz, the measured jitter is 2.46 ps (rms) and plusmn9.33 ps (pk-pk) at 200-MHz output frequency, while achievable maximum static...
In deep submicron era, to prevent larger amount of SRAM from more frequently encountered overheating problems and react accordingly for each possible hotspots, multiple ideal run-time temperature sensors must be closely located and response rapidly to secure system reliability while maintaining core frequency. This paper presented a method to extract run-time temperature information from multiple...
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