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Semiconductor testing, aimed at detecting manufacturing defects and marginalities, should be able to screen out fabrication artifacts that affect immediate as well as future mission-mode device performance. While a large amount of resources are dedicated towards catastrophic fault detection, parametric fault detection is an increasingly important research area. Parametric faults marginally affect...
In deep submicron era, to prevent larger amount of SRAM from more frequently encountered overheating problems and react accordingly for each possible hotspots, multiple ideal run-time temperature sensors must be closely located and response rapidly to secure system reliability while maintaining core frequency. This paper presented a method to extract run-time temperature information from multiple...
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