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In earlier, Fault Analysis (FA) has been exploited for several aspects of analog and digital testing. These include, test development, Design for Test (DFT) schemes qualification, and fault grading. Higher quality fault analysis will reduce the number of defective chips that slip past the tests and end up in customer's systems. This is commonly referred to as defective parts per million (DPM) that...
We present, implementation of a built-in current sensor (BICS) which takes into account the increased background current of defect-free circuits and the effects of process variation on ?IDDQ testing of CMOS data converters. A 12-bit digital-to-analog converter (DAC) is designed as the circuit under test (CUT). The BICS uses frequency as the output for fault detection in CUT. A fault is detected if...
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