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In scan-based testing environments, identifying the scan chain failures can be of significant help in guiding the failure analysis process for yield improvement. In this paper, we propose an efficient scan chain diagnosis method using a symbolic fault simulation to achieve high diagnostic resolution and small candidate list for single and multiple defects in scan chains. The main ideas of the proposed...
For the better analysis of failure diagnosis problems, firstly, using MATLAB software to simulate failure problems such as the emergence of regular power, short circuit and broken circuit. Combining the failure practical example, neural network analysis is introduced for diagnosis. Failure diagnosis using two kinds of neural networks: the BP network and Elman network training. Trainings choose rational...
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