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IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 10 > 2789 - 2791
2010 2nd International Conference on Computer Engineering and Technology > 5 > V5-130 - V5-133
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 10 > 2789 - 2791
2010 2nd International Conference on Computer Engineering and Technology > 5 > V5-130 - V5-133