Wyniki wyszukiwania
2016 IEEE International Reliability Physics Symposium (IRPS) > 6C-2-1 - 6C-2-5
IEEE Electron Device Letters > 2015 > 36 > 10 > 1030 - 1032
IEEE Electron Device Letters > 2015 > 36 > 9 > 975 - 977
IEEE Electron Device Letters > 2014 > 35 > 10 > 1019 - 1021
IEEE Journal of the Electron Devices Society > 2014 > 2 > 6 > 154 - 157