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2008 Congress on Image and Signal Processing > 3 > 344 - 348
IEEE Transactions on Instrumentation and Measurement > 2008 > 57 > 8 > 1786 - 1790
2008 Congress on Image and Signal Processing > 3 > 344 - 348
IEEE Transactions on Instrumentation and Measurement > 2008 > 57 > 8 > 1786 - 1790