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The paper presents recent results from studies of a surface topography of a platinum calibration grid on silicon substrate obtained in both contact and tapping modes of the AFM microscope. The results are analyzed in order to determine the influence of the scan set-up and the SPM probe onto estimated fractal parameters and surface anisotropy ratio.
W pracy zaprezentowano wstępne wyniki prac związanych z wykorzystaniem mikroskopii Shear Force do diagnostyki powierzchni. W metodzie tej ostrze skanujące wprawiane jest w drgania równolegle do powierzchni w częstotliwością bliską rezonansu, a następnie mierzona jest amplituda tych oscylacji w celu określenia odległości ostrza od powierzchni. Należy podkreślić fakt, iż ostrze znajduje się w odległości...
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