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The soft-error vulnerability of flip-flops has become an important factor in IC reliability in sub-100-nm CMOS technologies. In the present work the soft-error rate (SER) of a 65-nm flip-flop has been investigated with the use of alpha-accelerated testing. Simulations have been applied to study the flip-flop SER sensitivity in detail. Furthermore, an easy-to-use approach is presented to make an accurate...
Rapid prototyping allows for evaluation of design product in a short period of time. Designers or CEOs may perceive the size and appearance of the product by touching the automatically constructed physical objects produced through rapid prototyping. However, it is usually impossible to change its color, texture, and user interface. In this paper, we introduce 'Augmented Reality based Re-formable Mock-up',...
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