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IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 3 > 438 - 445
Electronics Letters > 2014 > 50 > 16 > 1152 - 1153
Electronics Letters > 2009 > 45 > 15 > 776 - 778
IEEE Electron Device Letters > 2009 > 30 > 6 > 638 - 640
IEEE Transactions on Nuclear Science > 2008 > 55 > 3-2 > 1376 - 1380
IEEE Transactions on Plasma Science > 2008 > 36 > 4-1 > 1262 - 1263