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Journal of Electronic Testing > 2014 > 30 > 6 > 653-663
Image and Vision Computing > 2008 > 26 > 6 > 863-870
IEEE Transactions on Signal Processing > 2007 > 55 > 6-2 > 3061 - 3072
Solid State Ionics > 1999 > 119 > 1-4 > 37-42