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Locating the scan chain faults is very important for dedicated IC manufacturers to guide the failure analysis process for yield improvement. In this paper, we propose a new symbolic simulation based scan chain diagnosis method to solve the scan chain diagnosis resolution problem as well as the multiple faults problem. The proposed method uses a new symbolic simulation with the faulty probabilities...
Scan chain based test has been a common and useful method for testing VLSI designs due to its high controllability and observability. However scan chains have recently been shown to pose security threat to cryptographic chips. Researchers have proposed various prevention architectures like scan tree followed by a compactor, locking and TAP architecture. But these solutions lead to huge hardware overhead...
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