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Future RF transceivers are expected to integrate the entire system, from baseband to antenna. Many emerging applications use beam forming, which necessitates RF phased arrays and multiple antennas integrated on the same die. This integration presents a challenge in testing the entire system including antennas. The electromagnetic signal output is combined in the air and no longer can be separated...
Negative Bias Temperature Instability (NBTI) is a degradation phenomenon that occurs in PMOS transistors during circuit lifetime. Recent works have proposed transistor level and circuit level models that allow designers to deal with such phenomenon. Based on these models and taking into account Random Dopant Fluctuation (RDF), we study the possibility of detecting SRAM core-cells that are prone to...
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