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In EMC analysis, electromagnetic near-field scanning of printed circuit boards as well as of large scale integrated circuits becomes more and more popular. One approach to measure electromagnetic field distributions with high spatial resolution and sensitivity is the use of miniature active field probes. A small dipole probe on GaAs substrate intended to be integrated with active circuitry is reported...
A 660 GHz local oscillator (LO) sub-system for the submillimeter array is designed, tested and aligned in the laboratory by optical and radio alignment. The LO unit employs a cascade tuneless frequency doubler-tripler based on the planar GaAs Schottky diode technology. It is found that a phase shifter inserted between the first and second multiplier stages can improve the frequency response of the...
At submillimeter wavelengths, planarity error of the near- field scanner may be considerable, and therefore, needs to be eliminated when high phase measurement accuracy is desired. In this paper, we consider a differential phase measurement method, where the scanner planarity profile is determined from the submillimeter-wave phase data, and thus, no specific planarity measurements with a tracking...
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