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Scan chain based test has been a common and useful method for testing VLSI designs due to its high controllability and observability. However scan chains have recently been shown to pose security threat to cryptographic chips. Researchers have proposed various prevention architectures like scan tree followed by a compactor, locking and TAP architecture. But these solutions lead to huge hardware overhead...
Scan test has been a common and useful method for testing VLSI designs due to the high controllability and observability it provides. These same properties have recently been shown to also be a security threat to the intellectual property on a chip (Yang et al., 2004). In order to defend from scan based attacks, we present the lock & key technique. Our proposed technique provides security while...
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