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A newly developed mapping-technique, “Mössbauer microscopy”, for 57Fe probes using a multi capillary X-ray lens (MCX) is tested by observing the two dimensional images of 57Fe deposited Si crystals and a stainless steel. The space resolution is reached down to about 20 μm. A possibility of three dimensional microscope is also mentioned.
A newly developed mapping-technique, “Mössbauer microscopy”, for 57Fe probes using a multi capillary X-ray lens (MCX) is tested by observing the two dimensional images of 57Fe deposited Si crystals and a stainless steel. The space resolution is reached down to about 20 μm. A possibility of three dimensional microscope is also mentioned.
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