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IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 4 > 529 - 536
IEEE Journal of Solid-State Circuits > 2008 > 43 > 1 > 172 - 179
2006 International Conference on Computer Design > 417 - 424
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 266 - 276
48th Midwest Symposium on Circuits and Systems, 2005. > 299 - 302 Vol. 1