Search results
Journal of Alloys and Compounds > 2017 > 722 > C > 259-264
Microelectronics Reliability > 2017 > 72 > C > 1-4
2017 IEEE International Reliability Physics Symposium (IRPS) > MR-4.1 - MR-4.4
IEEE Electron Device Letters > 2016 > 37 > 8 > 1048 - 1050
Nano Research > 2016 > 9 > 4 > 1071-1078
Current Applied Physics > 2016 > 16 > 1 > 88-92
Applied Surface Science > 2015 > 354 > Part A > 124-128
2015 IEEE International Reliability Physics Symposium > 2D.5.1 - 2D.5.5
2014 IEEE International Reliability Physics Symposium > 5A.4.1 - 5A.4.5
Journal of Alloys and Compounds > 2014 > 588 > Complete > 461-464
Microelectronic Engineering > 2013 > 107 > Complete > 91-96
2013 IEEE International Reliability Physics Symposium (IRPS) > 2C.4.1 - 2C.4.5
2013 IEEE International Reliability Physics Symposium (IRPS) > 3F.2.1 - 3F.2.5
IEEE Transactions on Semiconductor Manufacturing > 2013 > 26 > 4 > 549 - 555
Metals and Materials International > 2013 > 19 > 1 > 119-122
Thin Solid Films > 2012 > 521 > Complete > 146-149
Applied Surface Science > 2012 > 258 > 18 > 7225-7230